Advancing Nanocontamination Measurement and Control

Who We Are

Since our founding in 1991, CT Associates, Inc. has built a reputation for innovative and high-quality research, development, testing and instrument development in support of the semiconductor and medical device industries. From our technology base in contamination measurement and control, particle sizing technology, and filtration, we have expanded into other areas including organic particle precursors, component reliability, permeation measurement and modeling, and medical device testing. We have the expertise and analytical equipment necessary to assist you in new product development and solving your most difficult nanocontamination challenges.

What We Do

One of our core competencies is the measurement of nanoparticles. Our particle measurement expertise helps our customers identify nanoparticle contamination and optimize cleanliness in a variety of high purity process fluids.

mixture of gold and tin nanoparticles with scale bar

CT Associates, Inc. has developed a broad range of in-house tests as an offshoot of our R&D efforts. Our testing services can be used to supplement your R&D, or for third party certification.

We have the analytical equipment and facilities to handle aggressive chemistry such as ozone, hydrochloric (HCl), hydrofluoric (HF), and hot sulfuric acid. We also design custom tests to suit your target conditions.

plastic exposed to various chemicals to evaluate compatability

We use our experience and best practices with micro and nanoparticle analysis to quickly get you off the ground with particulate testing for your FDA compliance or R&D needs.

Our inline method can inspect 100% of the particulate shed, in real time. This enables per-manipulation results, which can be invaluable in developing or improving your product. Particles can also be captured on filters and fully prepared for SEM analysis.

Industries We Serve

Semiconductor and Nanotechnology

Neatly arranged syringe with needle and plastic tubes for central venous catheter insertion

Medical Devices

Featured Publication

Influence of Particle and Particle Precursor Contamination from High-Purity Polymer Components on On-wafer Particle Defectivity

The proportion of particles that stick to or form on a wafer from particle precursors is highly dependent on the chemical make-up of the contaminant. In this IRDS supported study, PFA was found to be up to 6 times “stickier” than PVDF. However, PVDF release a much high level of particles and particle precursor making this material a potentially higher risk to yield than PFA.