Advancing Nanocontamination Measurement and Control

Who We Are

Since our founding in 1991, CT Associates, Inc. has built a reputation for innovative and high-quality research, development, testing and instrument development in support of the semiconductor and medical device industries. From our technology base in contamination measurement and control, particle sizing technology, and filtration, we have expanded into other areas including organic particle precursors, component reliability, permeation measurement and modeling, and medical device testing. We have the expertise and analytical equipment necessary to assist you in new product development and solving your most difficult nanocontamination challenges.

What We Do

One of our core competencies is the measurement of nanoparticles. Our particle measurement expertise helps our customers identify nanoparticle contamination and optimize cleanliness in a variety of high purity process fluids.

mixture of gold and tin nanoparticles with scale bar

CT Associates, Inc. has developed a broad range of in-house tests as an offshoot of our R&D efforts. Our testing services can be used to supplement your R&D, or for third party certification.

We have the analytical equipment and facilities to handle aggressive chemistry such as ozone, hydrochloric (HCl), hydrofluoric (HF), and hot sulfuric acid. We also design custom tests to suit your target conditions.

plastic exposed to various chemicals to evaluate compatability

We use our experience and best practices with micro and nanoparticle analysis to quickly get you off the ground with particulate testing for your FDA compliance or R&D needs.

Our inline method can inspect 100% of the particulate shed, in real time. This enables per-manipulation results, which can be invaluable in developing or improving your product. Particles can also be captured on filters and fully prepared for SEM analysis.

Industries We Serve

Semiconductor and Nanotechnology

Neatly arranged syringe with needle and plastic tubes for central venous catheter insertion

Medical Devices

On-wafer Particle Counting to 8 nm, with Raman Spectroscopy

CT Associates, in collaboration with UNISERS AG, has completed the installation of the UNISERS’ research and development wafer inspection tool at our Minnesota facility. The tool's new home is our recently updated ISO Class 3 cleanroom. The tool is capable of detecting 8nm particles and larger on a wafer surface. We are in the final stage of qualification and are scheduled to begin full operation by the end of February 2024.

In addition to particle sizing on a wafer, the tool has the capability to chemically fingerprint particles using Raman Spectroscopy. Additional details can be found on the UNISERS website.

Correlation of mixed ion exchange resin extract as-measured in liquid (LNS) compared to on-wafer counts via UNISERS and KLA SP7 (Source: 2022 UPM IRDS SEMI Update)